大奖18娱乐(中国)官方网站

膜厚测试设备

Thin-film thickness of samples up to 450 mm in diameter aremapped quickly and easily with the F50 advanced spectralreflectance system The motorized r-theta stage movesautomatically to selected measurement points and providesthickness measurements as fast as two points per second TheF50 has the same precision high-lifetime stage that performsmillions of measurements in our production systems

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